Method | Selected features |
---|---|
BUS | TEP diff(B), Info measure correlation 2(B), Aspect ratio(B), Perimeter(B), Extent(B) |
CEUS | Wash-in slope, Convexity(C), Inverse difference moment normalized(C), Dice, Jaccard |
BUS+CEUS | Wash-in slope, Convexity(C), Inverse difference moment normalized(C), Dice, Aspect ratio(B), Extent(B), Cluster shade(C) |